Lewis M. Terman

关于作者

Lewis M. Terman was a prominent American psychologist best known for his work in the field of intelligence testing. He is widely recognized for his adaptation of the Binet-Simon scale, which led to the development of the Stanford-Binet Intelligence Scales. This test became one of the most widely used measures of intelligence in educational and psychological settings. Terman's research focused not only on measuring intelligence but also on understanding its implications for education and personal development.

In addition to his contributions to intelligence testing, Terman conducted extensive research on gifted individuals, particularly through his longitudinal study of gifted children, known as the Genetic Studies of Genius. His findings provided valuable insights into the characteristics and life outcomes of gifted individuals, influencing educational practices and policies related to gifted education. Terman's legacy continues to impact the field of psychology and education, shaping our understanding of intelligence and its role in human development.