Beschreibung
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.
Buchdetails
Format
Gebundene Ausgabe
Seiten
478 Seiten
Sprache
Englisch
Veröffentlicht
Nov 18, 2011
Verlag
ASM International
ISBN-10
1615038264
ISBN-13
9781615038268