Beschreibung
"Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "
Buchdetails
Format
Gebundene Ausgabe
Seiten
475 Seiten
Sprache
Englisch
Veröffentlicht
Apr 8, 1998
Verlag
CRC Press
ISBN-10
0824701828
ISBN-13
9780824701826