کتاب‌های Evgeni P. Gusev - BookPine

Microelectromechanical Systems (Materials and Devices IV) (Volume 1299)

Microelectromechanical Systems (Materials and Devices IV) (Volume 1299)

Frank W. Delrio

Fundamental Aspects of Ultrathin Dielectrics on Si-based Devices: Proceedings of the NATO Advanced Research Workshop on Fundamental Aspects of Ultrathin ... Science Partnership Subseries: 3 Book 47)

Fundamental Aspects of Ultrathin Dielectrics on Si-based Devices: Proceedings of the NATO Advanced Research Workshop on Fundamental Aspects of Ultrathin ... Science Partnership Subseries: 3 Book 47)

Eric Garfunkel

Advanced Materials and Technologies for Micro/Nano-Devices, Sensors and Actuators

Advanced Materials and Technologies for Micro/Nano-Devices, Sensors and Actuators

Evgeni P. Gusev

Advanced Gate Stack, Source/Drain, and Channel Engineering for Si-Based CMOS 6: ECS Transactions: Volume 28, Issue 1

Advanced Gate Stack, Source/Drain, and Channel Engineering for Si-Based CMOS 6: ECS Transactions: Volume 28, Issue 1

Evgeni P. Gusev

Defects in High-k Gate Dielectric Stacks

Defects in High-k Gate Dielectric Stacks

Evgeni P. Gusev

Advanced Gate Stacks for High-Mobility Semiconductors

Advanced Gate Stacks for High-Mobility Semiconductors

Athanasios Dimoulas

Nanotechnology for Electronic Materials and Devices

Nanotechnology for Electronic Materials and Devices

Anatoli Korkin

Advanced Gate Stacks for High-Mobility Semiconductors. Springer Series in Advanced Microelectronics, Volume 27.

Advanced Gate Stacks for High-Mobility Semiconductors. Springer Series in Advanced Microelectronics, Volume 27.

Athanasios Dimoulas

Defects in HIgh-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices

Defects in HIgh-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices

Evgeni P. Gusev

Defects in HIgh-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices

Defects in HIgh-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices

Evgeni P. Gusev

Defects in Highk Gate Dielectric Stacks

Defects in Highk Gate Dielectric Stacks

Evgeni P. Gusev

Advanced Gate Stack, Source/Drain, and Channel Engineering for Si-Based CMOS: New Materials, Processes, and Equipment 2005: Proceedings Of The International Symposium

Advanced Gate Stack, Source/Drain, and Channel Engineering for Si-Based CMOS: New Materials, Processes, and Equipment 2005: Proceedings Of The International Symposium

Evgeni P. Gusev

Rapid Thermal and Other Short-Time Processing Technologies III

Rapid Thermal and Other Short-Time Processing Technologies III

Paul J. Timans

Fundamental Aspects of Ultrathin Dielectrics on Si-based Devices

Fundamental Aspects of Ultrathin Dielectrics on Si-based Devices

Evgeni P. Gusev