Beschrijving
Spanning the critical advancements in pattern recognition, this collection presents the insights and findings from the 36th German Conference on Pattern Recognition held in Münster. It captures a diverse range of topics, showcasing cutting-edge research and developments in algorithms and methodologies vital for enhancing recognition capabilities across various applications.
Contributors include leading experts who present their peer-reviewed papers, reflecting the collaborative spirit of the conference. Readers will find a wealth of information that underscores the importance of pattern recognition in today's technology-driven world, making it a significant resource for researchers and practitioners alike.
Contributors include leading experts who present their peer-reviewed papers, reflecting the collaborative spirit of the conference. Readers will find a wealth of information that underscores the importance of pattern recognition in today's technology-driven world, making it a significant resource for researchers and practitioners alike.
Boekdetails
Formaat
Paperback
Pagina's
793 pagina's
Taal
Engels
Gepubliceerd
okt. 29, 2014
Uitgever
Springer
Edities
2 edities
ISBN-10
3319117513
ISBN-13
9783319117515