Описание
This volume presents an engaging exploration of electron microscopy techniques applied to both hard and soft materials, showcasing the innovative approaches employed by leading researchers in the field. The authors skillfully navigate through various methodologies, shedding light on intricate details that enhance understanding of material properties at the nanoscale.
With contributions from experts like T.J. Balk and A.P. Porter, the text fosters a deeper appreciation for the intersection of materials science and microscopy. Readers can expect to gain valuable insights into advancing research, bridging theoretical concepts with practical applications that resonate within contemporary science.
With contributions from experts like T.J. Balk and A.P. Porter, the text fosters a deeper appreciation for the intersection of materials science and microscopy. Readers can expect to gain valuable insights into advancing research, bridging theoretical concepts with practical applications that resonate within contemporary science.
Детали книги
Формат
Мягкая обложка
Страницы
47 страниц
Язык
Английский
Опубликовано
Sep 30, 2015
Издатель
Curran Associates
ISBN-10
1604234296
ISBN-13
9781604234299