Measurement Technology for Micro-Nanometer Devices

Measurement Technology for Micro-Nanometer Devices

Wendong Zhang , Tielin Shi , Zongmin Ma
Оценок пока нет
2017 · Английский · Твердый переплет · 2 editions
Добавить на полку

Оценить эту книгу


Экспортировать журнал книг

Описание

This book offers an in-depth exploration of advanced measurement technologies tailored for micro and nanometer devices. The authors, a collective of seasoned experts in the field, delve into cutting-edge methodologies that facilitate precision in measuring components at incredibly small scales. They address both theoretical frameworks and practical applications, making complex concepts accessible to a wide audience, including researchers and industry professionals.

By shedding light on the latest developments and innovations, the book serves as an essential reference for those embarking on projects in micro and nano-engineering. It emphasizes the importance of accurate measurement in ensuring the functionality and reliability of tiny devices, positioning itself as a crucial resource for anyone involved in this rapidly evolving discipline.

Детали книги

Формат Твердый переплет
Страницы 352 страниц
Язык Английский
Опубликовано Jan 17, 2017
Издатель Wiley
Издания 2 editions
ISBN-10 1118717961
ISBN-13 9781118717967
Добавить на полку

Оценить эту книгу


Экспортировать журнал книг