Scan Statistics: Methods and Applications

Scan Statistics: Methods and Applications

Joseph Glaz , Vladimir Pozdnyakov , Sylvan Wallenstein
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2009 · Английский · Твердый переплет
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Описание

Scan statistics is currently one of the most active and important areas of research in applied probability and statistics, having applications to a wide variety of archaeology, astronomy, bioinformatics, biosurveillance, molecular biology, genetics, computer science, electrical engineering, geography, material sciences, physics, reconnaissance, reliability and quality control, telecommunication, and epidemiology. Filling a gap in the literature, this self-contained volume brings together a collection of selected chapters illustrating the depth and diversity of theory, methods and applications in the area of scan statistics.

Детали книги

Формат Твердый переплет
Страницы 422 страниц
Язык Английский
Опубликовано May 28, 2009
Издатель Birkhäuser
ISBN-10 0817647481
ISBN-13 9780817647483
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