Описание
This book explores novel methods for implementing X-ray diffraction technology as an imaging modality, which have been made possible through recent breakthroughs in detector technology, computational power, and data processing algorithms. The ability to perform fast, spatially-resolved X-ray diffraction throughout the volume of a sample opens up entirely new possibilities in areas such as material analysis, cancer diagnosis, and explosive detection, thus offering the potential to revolutionize the fields of medical, security, and industrial imaging and detection. Featuring chapters written by an international selection of authors from both academia and industry, the book provides a comprehensive discussion of the underlying physics, architectures, and applications of X-ray diffraction imaging that is accessible and relevant to neophytes and experts alike.
Детали книги
Формат
Твердый переплет
Страницы
256 страниц
Язык
Английский
Опубликовано
Jan 1, 2018
Издатель
CRC Press
Издание
1
Издания
3 editions
ISBN-10
1498783619
ISBN-13
9781498783613