الوصف
This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.
تفاصيل الكتاب
تنسيق
غلاف ورقي
صفحات
404 صفحات
لغة
الإنجليزية
منشور
ديسمبر 10, 2013
الناشر
Springer
رقم ISBN-10
3642420230
رقم ISBN-13
9783642420238