Beschreibung
This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.
Buchdetails
Format
Taschenbuch
Seiten
404 Seiten
Sprache
Englisch
Veröffentlicht
Dec 10, 2013
Verlag
Springer
ISBN-10
3642420230
ISBN-13
9783642420238