Beschreibung
Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.
Buchdetails
Format
Gebundene Ausgabe
Seiten
191 Seiten
Sprache
Englisch
Veröffentlicht
Mar 2, 2012
Verlag
Springer
Ausgaben
2 Ausgaben
ISBN-10
146142190X
ISBN-13
9781461421900