Opis
Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.
Szczegóły książki
Format
Twarda okładka
Strony
191 stron
Język
Angielski
Opublikowany
Mar 2, 2012
Wydawca
Springer
Wydania
Wydania: 2
ISBN-10
146142190X
ISBN-13
9781461421900