Scan Statistics

Scan Statistics

Joseph Glaz , Joseph Naus , Sylvan Wallenstein
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2010 · Inglés · Tapa blanda · 3 ediciones
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Descripción

In many statistical applications, scientists have to analyze the occurrence of observed clusters of events in time or space. Scientists are especially interested in determining whether an observed cluster of events has occurred by chance if it is assumed that the events are distributed independently and uniformly over time or space. Scan statistics have relevant applications in many areas of science and technology including geology, geography, medicine, minefield detection, molecular biology, photography, quality control and reliability theory and radio-optics.

Detalles del libro

Formato Tapa blanda
Páginas 388 páginas
Idioma Inglés
Publicado Dec 6, 2010
Editorial Springer
Ediciones 3 ediciones
ISBN-10 1441931678
ISBN-13 9781441931672
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