Scan Statistics

Scan Statistics

Joseph Glaz , Joseph Naus , Sylvan Wallenstein
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2010 · 英語 · 平裝書 · 3 個版本
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描述

In many statistical applications, scientists have to analyze the occurrence of observed clusters of events in time or space. Scientists are especially interested in determining whether an observed cluster of events has occurred by chance if it is assumed that the events are distributed independently and uniformly over time or space. Scan statistics have relevant applications in many areas of science and technology including geology, geography, medicine, minefield detection, molecular biology, photography, quality control and reliability theory and radio-optics.

書籍詳情

格式 平裝書
頁數 388 頁
語言 英語
已出版 Dec 6, 2010
出版商 Springer
ISBN-10 1441931678
ISBN-13 9781441931672
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