Pattern Recognition, Machine Intelligence and Biometrics

Pattern Recognition, Machine Intelligence and Biometrics

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2011 · 英語 · ハードカバー · 2 editions
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説明

In the realm of technology and security, the fusion of pattern recognition and machine intelligence has emerged as a pivotal theme. This comprehensive work delves into the latest advancements in these fields, exploring their implications and applications in biometrics. The author, Patrick Shen-Pei Wang, synthesizes complex concepts and cutting-edge research, making them accessible to both experts and novices alike.

The book offers a rich tapestry of case studies and practical insights that demonstrate how innovative algorithms and machine learning techniques enhance identification and verification systems. With a focus on real-world applications, it highlights the transformative impact of these technologies on security measures, personal identification, and data protection.

Wang's work also emphasizes the ethical considerations and future challenges that are intrinsic to the rapid evolution of machine intelligence in the context of biometrics. Through thoughtful examination and analysis, he generates discourse on how societal implications intertwine with technological progress, providing a reflective space for readers to consider the broader consequences of these advancements.

本の詳細

形式 ハードカバー
ページ数 905ページ
言語 英語
公開されました Nov 15, 2011
出版社 Springer
ISBN-10 3642224067
ISBN-13 9783642224065

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