Pattern Recognition, Machine Intelligence and Biometrics

Pattern Recognition, Machine Intelligence and Biometrics

尚無評分
2011 · 英語 · 精裝書 · 2 editions
加入書架

評價這本書


出口書籍日誌

描述

In the realm of technology and security, the fusion of pattern recognition and machine intelligence has emerged as a pivotal theme. This comprehensive work delves into the latest advancements in these fields, exploring their implications and applications in biometrics. The author, Patrick Shen-Pei Wang, synthesizes complex concepts and cutting-edge research, making them accessible to both experts and novices alike.

The book offers a rich tapestry of case studies and practical insights that demonstrate how innovative algorithms and machine learning techniques enhance identification and verification systems. With a focus on real-world applications, it highlights the transformative impact of these technologies on security measures, personal identification, and data protection.

Wang's work also emphasizes the ethical considerations and future challenges that are intrinsic to the rapid evolution of machine intelligence in the context of biometrics. Through thoughtful examination and analysis, he generates discourse on how societal implications intertwine with technological progress, providing a reflective space for readers to consider the broader consequences of these advancements.

書籍詳情

格式 精裝書
頁數 905 頁
語言 英語
已出版 Nov 15, 2011
出版商 Springer
ISBN-10 3642224067
ISBN-13 9783642224065
加入書架

評價這本書


出口書籍日誌