Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, S+SSPR 2022, Montreal, QC, Canada, August 26-27, 2022

Name: Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, S+SSPR 2022, Montreal, QC, Canada, August 26-27, 2022
ISBN: 9783031230271

Adam Krzyzak , Ching Y. Suen , Andrea Torsello

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