Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, S+SSPR 2022, Montreal, QC, Canada, August 26-27, 2022

Name: Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, S+SSPR 2022, Montreal, QC, Canada, August 26-27, 2022
ISBN: 9783031230271

Adam Krzyzak , Ching Y. Suen , Andrea Torsello