Sampling, Wavelets, and Tomography

Sampling, Wavelets, and Tomography

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2003 · الإنجليزية · غلاف صلب · 2 طبعات
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الوصف

In this insightful work, the authors dive into the interconnected realms of sampling, wavelets, and tomography, illustrating how these mathematical principles converge in modern applications. They meticulously explore the foundational concepts while highlighting innovative methodologies and recent advancements that have transformed the field.

By blending theory with practical examples, the authors aim to provide a comprehensive understanding of how these mathematical tools enhance problem-solving across various disciplines. Readers will appreciate the clarity with which complex ideas are presented, making it accessible to both novices and seasoned experts. The engaging narrative invites readers to appreciate the beauty and utility of mathematics in tackling real-world challenges.

تفاصيل الكتاب

تنسيق غلاف صلب
صفحات 365 صفحات
لغة الإنجليزية
منشور ديسمبر 10, 2003
الناشر Birkhäuser
الطبعات 2 طبعات
رقم ISBN-10 0817643044
رقم ISBN-13 9780817643041

الأنواع

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