Sampling, Wavelets, and Tomography

Sampling, Wavelets, and Tomography

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2003 · Inglés · Tapa dura · 2 ediciones
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Descripción

In this insightful work, the authors dive into the interconnected realms of sampling, wavelets, and tomography, illustrating how these mathematical principles converge in modern applications. They meticulously explore the foundational concepts while highlighting innovative methodologies and recent advancements that have transformed the field.

By blending theory with practical examples, the authors aim to provide a comprehensive understanding of how these mathematical tools enhance problem-solving across various disciplines. Readers will appreciate the clarity with which complex ideas are presented, making it accessible to both novices and seasoned experts. The engaging narrative invites readers to appreciate the beauty and utility of mathematics in tackling real-world challenges.

Detalles del libro

Formato Tapa dura
Páginas 365 páginas
Idioma Inglés
Publicado dic. 10, 2003
Editorial Birkhäuser
Ediciones 2 ediciones
ISBN-10 0817643044
ISBN-13 9780817643041

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