Sampling, Wavelets, and Tomography

Sampling, Wavelets, and Tomography

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2003 · 英语 · 精装书 · 2 个版本
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描述

In this insightful work, the authors dive into the interconnected realms of sampling, wavelets, and tomography, illustrating how these mathematical principles converge in modern applications. They meticulously explore the foundational concepts while highlighting innovative methodologies and recent advancements that have transformed the field.

By blending theory with practical examples, the authors aim to provide a comprehensive understanding of how these mathematical tools enhance problem-solving across various disciplines. Readers will appreciate the clarity with which complex ideas are presented, making it accessible to both novices and seasoned experts. The engaging narrative invites readers to appreciate the beauty and utility of mathematics in tackling real-world challenges.

书籍详情

格式 精装书
页数 365 页
语言 英语
已发布 12月 10, 2003
出版商 Birkhäuser
ISBN-10 0817643044
ISBN-13 9780817643041

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