Electron Microscopy and Analysis

Electron Microscopy and Analysis

Peter J. Goodhew , John Humphreys , Richard Beanland
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Nov 30, 2000 · Englisch · Taschenbuch (264 Seiten)
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Buchdetails

Format Taschenbuch
Seiten 264
Sprache Englisch
Veröffentlicht Nov 30, 2000
Verlag CRC Press
ISBN-10 0748409688
ISBN-13 9780748409686

Beschreibung

Electron Microscopy and Analysis provides an insightful exploration into advanced imaging techniques that reveal the intricate details of materials at the microscopic level. The authors, esteemed experts in the field, delve into various methodologies, illustrating how they enhance our understanding of both the structure and composition of different substances.

Through a blend of theoretical knowledge and practical applications, readers are guided on how to effectively utilize these techniques for research and analysis. The text lays out essential concepts while showcasing the latest advancements, making it a valuable resource for both newcomers and seasoned professionals seeking to deepen their grasp of electron microscopy's capabilities.

Genres

Wissenschaft & Technologie
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