Electron Microscopy and Analysis

Electron Microscopy and Analysis

Peter J. Goodhew , John Humphreys , Richard Beanland
Aún sin calificaciones
Nov 30, 2000 · Inglés · Tapa blanda (264 páginas)
Añadir a la estantería

Califica este libro


Exportar diario de lectura

Detalles del libro

Formato Tapa blanda
Páginas 264
Idioma Inglés
Publicado Nov 30, 2000
Editorial CRC Press
ISBN-10 0748409688
ISBN-13 9780748409686

Descripción

Electron Microscopy and Analysis provides an insightful exploration into advanced imaging techniques that reveal the intricate details of materials at the microscopic level. The authors, esteemed experts in the field, delve into various methodologies, illustrating how they enhance our understanding of both the structure and composition of different substances.

Through a blend of theoretical knowledge and practical applications, readers are guided on how to effectively utilize these techniques for research and analysis. The text lays out essential concepts while showcasing the latest advancements, making it a valuable resource for both newcomers and seasoned professionals seeking to deepen their grasp of electron microscopy's capabilities.

Géneros

Ciencia y Tecnología
Añadir a la estantería

Califica este libro


Exportar diario de lectura