Electron Microscopy and Analysis

Electron Microscopy and Analysis

Peter J. Goodhew , John Humphreys , Richard Beanland
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Nov 30, 2000 · Английский · Мягкая обложка (264 страницы)
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Детали книги

Формат Мягкая обложка
Страницы 264
Язык Английский
Опубликовано Nov 30, 2000
Издатель CRC Press
ISBN-10 0748409688
ISBN-13 9780748409686

Описание

Electron Microscopy and Analysis provides an insightful exploration into advanced imaging techniques that reveal the intricate details of materials at the microscopic level. The authors, esteemed experts in the field, delve into various methodologies, illustrating how they enhance our understanding of both the structure and composition of different substances.

Through a blend of theoretical knowledge and practical applications, readers are guided on how to effectively utilize these techniques for research and analysis. The text lays out essential concepts while showcasing the latest advancements, making it a valuable resource for both newcomers and seasoned professionals seeking to deepen their grasp of electron microscopy's capabilities.

Жанры

Наука и технологии
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