Descrizione
This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.
Dettagli del libro
Formato
Brossura
Pagine
230 pagine
Lingua
Inglese
Pubblicato
nov 28, 2014
Editore
Springer
Edizioni
2 edizioni
ISBN-10
1489989528
ISBN-13
9781489989529