Opis
This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.
Szczegóły książki
Format
Miękka okładka
Strony
230 stron
Język
Angielski
Opublikowany
lis 28, 2014
Wydawca
Springer
Wydania
Wydania: 2
ISBN-10
1489989528
ISBN-13
9781489989529