Description
This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.
Book Details
Format
Paperback
Pages
230 pages
Language
English
Published
Nov 28, 2014
Publisher
Springer
Editions
2 editions
ISBN-10
1489989528
ISBN-13
9781489989529