• 英语
  • 西班牙语
  • 法语
  • 德语
  • 葡萄牙语
  • 意大利语
  • 俄语
  • 简体中文
  • 繁体中文
  • 日语
  • 韩语
  • 荷兰语
  • 瑞典语
  • 波斯语
  • 阿拉伯语
  • 波兰语
  • 首页
  • 发现
  • 文章
  • 登录
  • 注册
  • 英语
  • 西班牙语
  • 法语
  • 德语
  • 葡萄牙语
  • 意大利语
  • 俄语
  • 简体中文
  • 繁体中文
  • 日语
  • 韩语
  • 荷兰语
  • 瑞典语
  • 波斯语
  • 阿拉伯语
  • 波兰语
ISBN 条形码扫描器
用条形码扫描几秒钟添加书籍。

只需扫描ISBN即可立即将其添加到您的图书馆。现已支持iOS和Android。

应用商店 谷歌播放
David G. Seiler

David G. Seiler

概览 书籍
Metrology and Diagnostic Techniques for Nanoelectronics

Metrology and Diagnostic Techniques for Nanoelectronics

Zhiyong Ma

Frontiers of Characterization and Metrology for Nanoelectronics: 2011

Frontiers of Characterization and Metrology for Nanoelectronics: 2011

David G. Seiler

Frontiers of Characterization and Metrology for Nanoelectronics: 2009

Frontiers of Characterization and Metrology for Nanoelectronics: 2009

David G. Seiler

Characterization and Metrology for Nanoelectronics (2007 International Conference on Frontiers of Characterization and Metrology)

Characterization and Metrology for Nanoelectronics (2007 International Conference on Frontiers of Characterization and Metrology)

David G. Seiler

Life on Hold: Finding Hope in the Face of Serious Illness

Life on Hold: Finding Hope in the Face of Serious Illness

David G. Seiler

Characterization and Metrology for ULSI Technology 2005

Characterization and Metrology for ULSI Technology 2005

David G. Seiler

Characterization and Metrology for ULSI Technology (2003 International Conference)

Characterization and Metrology for ULSI Technology (2003 International Conference)

David G. Seiler

Characterization and Metrology for ULSI Technology 2000: International Conference

Characterization and Metrology for ULSI Technology 2000: International Conference

David G. Seiler

Optical Characterization in Microelectronics Manufacturing

Optical Characterization in Microelectronics Manufacturing

Sidney Perkowitz

Semiconductors and Semimetals, Volume 36: The Spectroscopy of Semiconductors

Semiconductors and Semimetals, Volume 36: The Spectroscopy of Semiconductors

Robert K. Willardson

Two-Photon Absorption Characterization

Two-Photon Absorption Characterization

David G. Seiler

Hot electrons in semiconductors: Proceedings of the International Conference on Hot Electrons in Semiconductors held in Denton, Texas, 6-8 July 1977

Hot electrons in semiconductors: Proceedings of the International Conference on Hot Electrons in Semiconductors held in Denton, Texas, 6-8 July 1977

David G. Seiler

Life on Hold: Finding Hope in the Face of Serious Illness

Life on Hold: Finding Hope in the Face of Serious Illness

David G. Seiler

通过BookPine追踪您的阅读旅程,发现新书,并实现您的阅读目标。

应用商店 谷歌播放
发现
  • 发现
账户
  • 登录
  • 注册
支持
  • 常见问题解答
  • 功能请求
  • 联系
条款
  • 服务条款
  • 隐私政策
  • Cookie 政策
  • 管理Cookies

版权 © 2026 BookPine. 版权所有。

发送反馈

我们使用cookies来改善您的体验并分析网站流量。您可以选择接受哪些cookies。

必需

网站运行所必需的。不能被禁用。

分析

帮助我们了解访客如何与我们的网站互动。

市场营销

用于投放相关广告和跟踪活动。