Local Pattern Detection: International Seminar Dagstuhl Castle, Germany, April 12-16, 2004, Revised Selected Papers

Local Pattern Detection: International Seminar Dagstuhl Castle, Germany, April 12-16, 2004, Revised Selected Papers

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2005 · English · Paperback · 2 editions
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Description

At the heart of this collection lies a significant exploration of pattern detection, shaped by insightful discussions from an international seminar held in the picturesque Dagstuhl Castle. With contributions from leading experts, this work delves into the advancements made possible by the exponential growth of computer storage capabilities over the past decade.

Readers will find a rich tapestry of revised papers that highlight innovative methodologies and applications in local pattern detection. Each piece reflects not only the progress made in this field but also the collaborative spirit that drives continual improvement and exploration in the realm of data analysis.

Book Details

Format Paperback
Pages 244 pages
Language English
Published Jul 14, 2005
Publisher Springer
Editions 2 editions
ISBN-10 3540265430
ISBN-13 9783540265436

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