Fundamentals Of Atomic Force Microscopy - Part I: Foundations

This engaging work delves into the foundational concepts of atomic force microscopy (AFM), a crucial tool in the realm of nanoscience. The author, Ronald G. Reifenberger, meticulously unpacks the principles that underpin the operation and application of AFM, making complex topics accessible to readers with varying levels of expertise. Emphasizing the interdisciplinary nature of the AFM, the narrative bridges across physics, materials science, and engineering, illustrating how this innovative instrument has revolutionized the study of surfaces and materials at the nanoscale.

Throughout the chapters, readers are introduced to the operational mechanics of AFM, including its key components and measurement techniques. Beyond the technical details, Reifenberger emphasizes the practical implications of AFM in research and technology. Through clear explanations and insightful illustrations, the foundations of this advanced microscopy technique are laid bare, inviting both novices and experts alike to deepen their understanding of its significance in modern science.