Detalles del libro
Formato
Tapa blanda
Páginas
494
Idioma
Inglés
Publicado
Mar 6, 2008
Editorial
Wiley
Descripción
About the AuthorFrank Buschmann, Siemens AG, Germany Kevlin Henney, Curbralan, Bristol, UK Douglas C. Schmidt, Vanderbilt University, Nashville, Tennessee, USATable of ContentsPatternsArchitectural PatternsDesign PatternsIdiomsPattern SystemsPatterns and Software ArchitectureThe Pattern CommunityWhere Will Patterns Go?NotationsGlossaryReferencesIndex of Patterns