Détails du livre
Format
Broché
Pages
494
Langue
Anglais
Publié
Mar 6, 2008
Éditeur
Wiley
Description
About the AuthorFrank Buschmann, Siemens AG, Germany Kevlin Henney, Curbralan, Bristol, UK Douglas C. Schmidt, Vanderbilt University, Nashville, Tennessee, USATable of ContentsPatternsArchitectural PatternsDesign PatternsIdiomsPattern SystemsPatterns and Software ArchitectureThe Pattern CommunityWhere Will Patterns Go?NotationsGlossaryReferencesIndex of Patterns