Boekdetails
Formaat
Paperback
Pagina's
494
Taal
Engels
Gepubliceerd
Mar 6, 2008
Uitgever
Wiley
Beschrijving
About the AuthorFrank Buschmann, Siemens AG, Germany Kevlin Henney, Curbralan, Bristol, UK Douglas C. Schmidt, Vanderbilt University, Nashville, Tennessee, USATable of ContentsPatternsArchitectural PatternsDesign PatternsIdiomsPattern SystemsPatterns and Software ArchitectureThe Pattern CommunityWhere Will Patterns Go?NotationsGlossaryReferencesIndex of Patterns