書籍詳情
格式
平裝書
頁數
494
語言
英語
已出版
Mar 6, 2008
出版商
Wiley
描述
About the AuthorFrank Buschmann, Siemens AG, Germany Kevlin Henney, Curbralan, Bristol, UK Douglas C. Schmidt, Vanderbilt University, Nashville, Tennessee, USATable of ContentsPatternsArchitectural PatternsDesign PatternsIdiomsPattern SystemsPatterns and Software ArchitectureThe Pattern CommunityWhere Will Patterns Go?NotationsGlossaryReferencesIndex of Patterns