Детали книги
Формат
Мягкая обложка
Страницы
494
Язык
Английский
Опубликовано
Mar 6, 2008
Издатель
Wiley
Описание
About the AuthorFrank Buschmann, Siemens AG, Germany Kevlin Henney, Curbralan, Bristol, UK Douglas C. Schmidt, Vanderbilt University, Nashville, Tennessee, USATable of ContentsPatternsArchitectural PatternsDesign PatternsIdiomsPattern SystemsPatterns and Software ArchitectureThe Pattern CommunityWhere Will Patterns Go?NotationsGlossaryReferencesIndex of Patterns