Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability. Frontiers in Electronic Testing, Volume 37.

Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability. Frontiers in Electronic Testing, Volume 37.

Mohammad Tehranipoor

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Jan 1, 2008 · English · eBook (411 pages)

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Book Details

Format eBook

Pages 411

Language English

Published Jan 1, 2008

Publisher Springer

ISBN-10 1281140163

ISBN-13 9781281140166

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