Beschreibung
Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. The same instrumentation can also be used to quantify directly the forces of interfacial interaction in such environments an
Buchdetails
Format
Kindle
Seiten
501 Seiten
Sprache
Englisch
Veröffentlicht
Aug 12, 2009
Verlag
ELSEVIER SCIENCE & TECHNOLOGY
ISBN-10
6612288809
ISBN-13
9786612288807