توضیحات
Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. The same instrumentation can also be used to quantify directly the forces of interfacial interaction in such environments an
جزئیات کتاب
فرمت
کیندل
صفحات
501 صفحه
زبان
انگلیسی
منتشر شده
اوت 12, 2009
ناشر
ELSEVIER SCIENCE & TECHNOLOGY
ISBN-10
6612288809
ISBN-13
9786612288807