Opis
Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. The same instrumentation can also be used to quantify directly the forces of interfacial interaction in such environments an
Szczegóły książki
Format
Kindle
Strony
501 stron
Język
Angielski
Opublikowany
sie 12, 2009
Wydawca
ELSEVIER SCIENCE & TECHNOLOGY
ISBN-10
6612288809
ISBN-13
9786612288807