Beschrijving
Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. The same instrumentation can also be used to quantify directly the forces of interfacial interaction in such environments an
Boekdetails
Formaat
Kindle
Pagina's
501 pagina's
Taal
Engels
Gepubliceerd
aug. 12, 2009
Uitgever
ELSEVIER SCIENCE & TECHNOLOGY
ISBN-10
6612288809
ISBN-13
9786612288807