Beskrivning
Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. The same instrumentation can also be used to quantify directly the forces of interfacial interaction in such environments an
Bokdetaljer
Format
Kindle
Sidor
501 sidor
Språk
Engelska
Publicerad
aug 12, 2009
Förlag
ELSEVIER SCIENCE & TECHNOLOGY
ISBN-10
6612288809
ISBN-13
9786612288807