Descripción
Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. The same instrumentation can also be used to quantify directly the forces of interfacial interaction in such environments an
Detalles del libro
Formato
Kindle
Páginas
501 páginas
Idioma
Inglés
Publicado
ago. 12, 2009
Editorial
ELSEVIER SCIENCE & TECHNOLOGY
ISBN-10
6612288809
ISBN-13
9786612288807