Descrição
Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. The same instrumentation can also be used to quantify directly the forces of interfacial interaction in such environments an
Detalhes do Livro
Formato
Kindle
Páginas
501 páginas
Idioma
Inglês
Publicado
ago 12, 2009
Editora
ELSEVIER SCIENCE & TECHNOLOGY
ISBN-10
6612288809
ISBN-13
9786612288807