Description
Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. The same instrumentation can also be used to quantify directly the forces of interfacial interaction in such environments an
Détails du livre
Format
Kindle
Pages
501 pages
Langue
Anglais
Publié
août 12, 2009
Éditeur
ELSEVIER SCIENCE & TECHNOLOGY
ISBN-10
6612288809
ISBN-13
9786612288807