Описание
Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. The same instrumentation can also be used to quantify directly the forces of interfacial interaction in such environments an
Детали книги
Формат
Kindle
Страницы
501 страниц
Язык
Английский
Опубликовано
авг 12, 2009
Издатель
ELSEVIER SCIENCE & TECHNOLOGY
ISBN-10
6612288809
ISBN-13
9786612288807