Детали книги
Формат
Kindle
Страницы
501
Язык
Английский
Опубликовано
Aug 12, 2009
Издатель
ELSEVIER SCIENCE & TECHNOLOGY
ISBN-10
6612288809
ISBN-13
9786612288807
Описание
Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. The same instrumentation can also be used to quantify directly the forces of interfacial interaction in such environments an