Descrizione
Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. The same instrumentation can also be used to quantify directly the forces of interfacial interaction in such environments an
Dettagli del libro
Formato
Kindle
Pagine
501 pagine
Lingua
Inglese
Pubblicato
ago 12, 2009
Editore
ELSEVIER SCIENCE & TECHNOLOGY
ISBN-10
6612288809
ISBN-13
9786612288807